Jim Bain

Department of Electrical and Computer Engineering, Carnegie Mellon University
Ph.D., Materials Science and Engineering, Stanford University, 1993

Information Storage Systems Physics

As Associate Director of the Data Storage Systems Center at Carnegie Mellon, Professor Bain is interested in storage systems architectures and performance specifications, as they set the requirements for storage devices. Specifically, he is interested in how systems specifications set the performance requirements for recording heads - the transducers that must deliver energy to the recording medium and thus change its state in a reproducible way. Within this context Prof Bain has been an avid particpant in roadmapping and workshops on magnetic disk technology, magnetic tape technology, optical disk technology and probe storage technology.

Thin Films and Devices for Information Storage Systems

Within information storage systems like hard disk drives, tape drives, etc., there are core technologies in thin film materials and devices that are used to fabricate heads and media. Prof Bain has an active research program in the fabrication of and characterization of these materials and devices. Specific examples of recent areas of activity are:

  • Thin film FeCo alloys for high magnetization write poles
  • Magnetic pole dynamics in high speed write heads
  • Very small aperture lasers for near field optical and heat assisted magnetic recording
  • Field emission assisted magnetic probe recording
  • Nanostructured magnetic disk media using self-organized nanomasks
  • Sputtered thin film media for tape using CoCrPt/SiO2 composite media
  • Cr-SrZrO3 materials for resistance switching applications
Most Cited Publications: 
  1. "Single-chip computers with microelectromechanical systems-based magnetic memory,"  L. Richard Carley, James A. Bain, Gary K. Fedder, David W. Greve, David F. Guillou, Michael S. C. Lu, Tamal Mukherjee, Suresh Santhanam, Leon Abelmann and Seungook Min, J. Appl. Phys. 87, 6680 (2000)
  2. "Stress determination in textured thin films using X-ray diffraction," B.M. Clemens and J.A. Bain, MRS Bulletin 17 (07), 46-51 (1992)
  3. "Influence of stress and texture on soft magnetic properties of thin films," P Zou, W Yu, JA Bain, Magnetics IEEE Transactions on 38 (5), 3501 (2002)
  4. "Imaging of quantized magnetostatic modes using spatially resolved ferromagnetic resonance," S. Tamaru, J. A. Bain, R. J. M. van de Veerdonk, T. M. Crawford, M. Covington and M. H. Kryder, J. Appl. Phys. 91, 8034 (2002)
  5. "Imaging of optical field confinement in ridge waveguides fabricated on very-small-aperture laser," Fang Chen, A. Itagi, J. A. Bain, D. D. Stancil, T. E. Schlesinger, L. Stebounova, G. C. Walker and B. B. Akhremitchev, Appl. Phys. Lett. 83, 3245 (2003)
Recent Publications: 
  1.  "Design Criteria in Sizing Phase-Change RF Switches," G. Slovin, M. Xu, R. Singh, T. E. Schlesinger, J. Paramesh and J. A. Bain, IEEE Transactions on Microwave Theory and Techniques, 65, 4531 (2017)
  2. "A Reconfigurable Dual-Frequency Narrowband CMOS LNA Using Phase-Change RF Switches," Rahul Singh, Gregory Slovin, Min Xu, T. E. Schlesinger, James A. Bain, Jeyanandh Paramesh, IEEE Transactions on Microwave Theory and Techniques Volume PP Issue 9
  3. "Scaling behavior of oxide-based electrothermal threshold switching devices," Dasheng Li , Jonathan M. Goodwill, James A. Bain and Marek Skowronski,  Nanoscale 9, 14139 (2017)
  4. "ON-state evolution in lateral and vertical VO2 threshold switching devices," Dasheng Li, Abhishek A Sharma, Nikhil Shukla, Hanjong Paik, Jonathan M Goodwill, Suman Datta, Darrell G Schlom, James A Bain and Marek kowronski,  28, 405201 (2017)
  5. "Origin and Optimization of RF Power Handling Limitations in Inline Phase-Change Switches," Nabil El-Hinnawy, Pavel Borodulin, Matthew R King, Carlos R Padilla, Andris Ezis, Doyle T Nichols, Jeyanandh Paramesh, James A Bain, Robert M Young, IEEE Transactions on Electron Devices 64, 3934 (2017)
  6. "Electro-Thermal Model of Threshold Switching in TaOx-Based Devices.," Goodwill JM, Sharma AA, Li D, Bain JA, Skowronski M., ACS Appl. Mater. Interfaces 9, 11704 (2017)

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